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| Samtec offers a comprehensive, user friendly data base for high speed connector testing and simulation. | |
| Testing Services | |
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Samtec's Testing and Modeling Capabilities use a variety of test equipment and software. Click here to view Samtec's High Speed Test Equipment and Software List. Samtec is now offering
"on request" test data including eye patterns for our Final
Inch® circuits using our new Agilent PLTS 50 GHz Characterization
System. For more information on this new service, click here. |
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| NOTE: Please be aware that we have recently changed our High Speed Characterization Test Procedures. For an overview of our new approach, click here. | |
| Our Connector System Speed Rating is now based on the -3dB insertion loss point of the measured connector system. For more information on Samtec's Connector System Speed Rating, click here. |
Custom
Testing and Simulation can be done for your specific application for the
connector itself, the connector with traces routed from the PCB footprint
(the final inch®), the subsystem or your complete system. For more information
on these services, contact .
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| Click here
to view our White Paper on the Comparison
of Vector Network Analyzer and TDA Systems IConnect® Generated S-Parameters Click here to view our White Paper on the Dynamic Range Determination and S-Parameter Accuracy Validation For High Frequency Time Domain Network Analyzer (TDNA) Measurements |
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Click on the icon
to contact our Signal Integrity Group, call them at 1-800-726-8329 (812-944-6733) ext. 2330 or email them at .
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